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Shenzhen chuangxin Equipment Co.,LTD

Products >> Jointed Test Finger IEC61032 Test Probe B

Jointed Test Finger IEC61032 Test Probe B

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Description
Product Name: Jointed Test Finger IEC61032 Test Probe B
Supply Ability: Shenzhen chuangxin Equipment Co.,LTD.
Related proudcts iec61032 test probe, test probe b,
Specifications Jointed Test Finger IEC61032 Test Probe B
Price Term: FOB
Port of loading: shen zhen
Minimum Order 1
Unit Price: USD300-500

Jointed Test Finger IEC61032 Test Probe B

1.Application:

Thisisthe“International”testfingerrequiredbymostIEC,ENandCSAStandards,inadditiontomanyULStandards.Builtinstrictaccordancetothenewestrequirements–withintegrar palmsimulator.
This jointed test probe is strictly designed and manufactured according toIEC61032 , IEC60335, IEC60529and GB/T4208,GB4706.1,GB/T16842 standards.
ThisistheONLYFingerProbeavailablewithaintegraljackinthehandleforcontinuitytesting-as mandatedbytheIECCBScheme.Finger is madeofchromeplatedsteel/stainless steel.Allpartsprecision machined.
Test Finger Probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code. Also used to verify protection from access with the back of the hand for an IP suffix A code.
2.Technical paremeter:

Knurled finger diameter 12mm
Knurlerfinger length 80mm
Baffle plate diameter 50mm
Baffle plate length 100mm
Baffle thickness 20mm
Reference IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032, IEC69745-1


Contact Us
Company: Shenzhen chuangxin Equipment Co.,LTD
Contact: Mr. hong wu
Address: Xi Xiang Hua Qiao Village, Bao an, Shenzhen, China
Postcode: 518021
Tel: 86-755-61577692
Fax: 86-755-61577693
E-mail:         


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